Diffraction from metallic objects in radar imaging
- The paper describes the modelling of diffraction effects in radar imaging scans at and near sharp-edged metallic objects as the aperture dimension is close to the dimension of the object to be scanned. We evaluate the Fresnel-Kirchhoff integral within the process of radar imaging for an \(\bf 1\)D synthetic aperture radar. The resulting compact imaging model describes the diffraction effects in a single convolution-based formula. This is the basis for the simulative analysis in which the derived model is compared to a numerical radar imaging model. Further, we test our derived diffraction model experimentally. It confirms the developed theory and opens up additional areas of application for diffraction effect impacted radar imaging. This might be: high precision cross-range measurement with micrometer accuracy; highly precise surface reconstruction unveiling surface uncertainties in the low double-digit micrometer range; and model-based radar image enhancement.
| Author: | Sebastian SchlosserORCiDGND, André FroehlyORCiDGND, Reinhold HerschelORCiDGND, Nils PohlORCiDGND |
|---|---|
| URN: | urn:nbn:de:hbz:294-102775 |
| DOI: | https://doi.org/10.1109/JMW.2022.3200304 |
| Parent Title (English): | IEEE journal of microwaves |
| Subtitle (English): | theory, simulation, and experimental verification |
| Publisher: | IEEE |
| Place of publication: | New York, USA |
| Document Type: | Article |
| Language: | English |
| Date of Publication (online): | 2023/10/23 |
| Date of first Publication: | 2022/10/07 |
| Publishing Institution: | Ruhr-Universität Bochum, Universitätsbibliothek |
| Tag: | Open Access Fonds Diffraction; millimeter wave radar; radar imaging; radar measurements; radar theory; synthetic aperture radar (SAR) |
| Volume: | 2 |
| Issue: | 4 |
| First Page: | 626 |
| Last Page: | 636 |
| Note: | Article Processing Charge funded by the Deutsche Forschungsgemeinschaft (DFG) and the Open Access Publication Fund of Ruhr-Universität Bochum. |
| Institutes/Facilities: | Lehrstuhl für Integrierte Systeme |
| Dewey Decimal Classification: | Technik, Medizin, angewandte Wissenschaften / Elektrotechnik, Elektronik |
| open_access (DINI-Set): | open_access |
| faculties: | Fakultät für Elektrotechnik und Informationstechnik |
| Licence (English): |  Creative Commons - CC BY 4.0 - Attribution 4.0 International |
